Active Thermography
for semiconductors

Electronics testing

Passive thermography is often used in the electronics sector to measure power losses (dissipation). Active thermography can also localise faults in assemblies and components with very high local resolution. The lockin technique can detect extremely small temperature differences in the µK range.

Electronics testing in a nutshell

Defects in semiconductors can be detected by means of dissipated energy or photo-electric effects. Active thermography can do both. The wavelength range of the sensor (infrared camera) is adapted to the task. As a result, local resolutions in the µm range can be achieved.

Applications of electronics testing

Damage analysis on passive or active components, rapid fault localisation in complex assemblies, measurement of efficiency based on thermal losses: thermography is used in all these applications.